Electrical characterization of interface stability between magnesium and selenium-passivated n -type silicon (001)

Author： Udeshi D. Ali M. Y. Tao M. Maldonado E. Basit N. Kirk W. P.

ISSN： 1362-3060

Source： International Journal of Electronics, Vol.92, Iss.12, 2005-12, pp. : 719-727

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