Substrate characterization: simulation and measurement at high microwave frequencies

Author： Free Charles Tian Zhengrong Barnwell Peter

ISSN： 1356-5362

Source： Microelectronics International, Vol.18, Iss.1, 2001-01, pp. : 32-34

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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