2D analysis of functional stress degradations on power VDMOS transistor

Author： Beydoun B Zoaeter M Alaeddine A Rachidi I Bahsoun F Charlot J-J. Charles J-P.

ISSN： 1356-5362

Source： Microelectronics International, Vol.21, Iss.2, 2004-02, pp. : 16-22

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