Author: Goh Teck Joo Seetharamu K.N. Quadir G.A. Zainal Z.A. Ganeshamoorthy K Jeevan
Publisher: Emerald Group Publishing Ltd
ISSN: 1356-5362
Source: Microelectronics International, Vol.21, Iss.3, 2004-03, pp. : 29-43
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Abstract