Evaluation of a Spherical Aberration Constant of the Objective Lens of HVEM at Tohoku University

By Park Gyeong-Su   Shindo Daisuke  

Journal of Electron Microscopy, Vol. 45, Iss. 2, 1996-04 ,pp. : 152-158

Oxford University Press

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Performances of an 80200 kV microscope employing a cold-FEG and an aberration-corrected objective lens

By Ricolleau Christian   Nelayah Jaysen   Oikawa Tetsuo   Kohno Yuji   Braidy Nadi   Wang Guillaulle   Hue Florian   Florea Lenuta   Pierron Bohnes Vronique   Alloyeau Damien  

Journal of Electron Microscopy, Vol. 62, Iss. 2, 2013-04 ,pp. : 283-293

Oxford University Press

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Contrast enhancement in the phase plate transmission electron microscopy using an objective lens with a long focal length

By Minoda Hiroki   Okabe Tatsuhiro   Iijima Hirofumi  

Journal of Electron Microscopy, Vol. 60, Iss. 5, 2011-10 ,pp. : 337-343

Oxford University Press

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Calibration of projector lens distortions

By Hüe F.  

Journal of Electron Microscopy, Vol. 54, Iss. 3, 2005-06 ,pp. : 181-190

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In situ SEM micro-indentation of single wood pulp fibres in transverse direction

By Adusumalli Ramesh-Babu   Raghavan Rejin   Schwaller Patrick   Zimmermann Tanja   Michler Johann  

Journal of Electron Microscopy, Vol. 59, Iss. 5, 2010-10 ,pp. : 345-349

Oxford University Press

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