A review of focused ion beam technology and its applications in transmission electron microscopy

By Sugiyama Masaaki   Sigesato Genichi  

Journal of Electron Microscopy, Vol. 53, Iss. 5, 2004-10 ,pp. : 527-536

Oxford University Press

Access to resources Recommend Favorite

Specimen preparation for high-resolution transmission electron microscopy using focused ion beam and Ar ion milling

By Sasaki Hirokazu  

Journal of Electron Microscopy, Vol. 53, Iss. 5, 2004-10 ,pp. : 497-500

Oxford University Press

Access to resources Recommend Favorite

Application of focused ion beam techniques and transmission electron microscopy to thin-film transistor failure analysis

By Tsuji Satoshi  

Journal of Electron Microscopy, Vol. 53, Iss. 5, 2004-10 ,pp. : 465-470

Oxford University Press

Access to resources Recommend Favorite

Removing focused ion-beam damages on transmission electron microscopy specimens by using a plasma cleaner

By Hata Satoshi   Sosiati Harini   Kuwano Noriyuki   Itakura Masaru   Nakano Takayoshi   Umakoshi Yukichi  

Journal of Electron Microscopy, Vol. 55, Iss. 1, 2006-01 ,pp. : 23-26

Oxford University Press

Access to resources Recommend Favorite

Transmission electron microscopy and atom probe specimen preparation from mechanically alloyed powder using the focused ion-beam lift-out technique

By Choi Pyuck-Pa   Kwon Young-Soon   Kim Ji-Soon   Al-Kassab Tala’at  

Journal of Electron Microscopy, Vol. 56, Iss. 2, 2007-04 ,pp. : 43-49

Oxford University Press

Access to resources Recommend Favorite