Three-dimensional evaluation of an independent multi-walled carbon nanotube probe by tomography with high-resolution transmission electron microscope

By Tanigaki Toshiaki   Hidaka Kishio   Hirooka Motoyuki   Nakata Toshihiko  

Journal of Electron Microscopy, Vol. 60, Iss. 1, 2011-02 ,pp. : 19-24

Oxford University Press

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New method for quantitative mapping of metallic elements in tissue sections by electron probe microanalyser with wavelength dispersive spectrometers

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Journal of Electron Microscopy, Vol. 50, Iss. 1, 2001-02 ,pp. : 77-82

Oxford University Press

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Transmission electron microscopy and atom probe specimen preparation from mechanically alloyed powder using the focused ion-beam lift-out technique

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Journal of Electron Microscopy, Vol. 56, Iss. 2, 2007-04 ,pp. : 43-49

Oxford University Press

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Mapping of minority carrier lifetime distributions in multicrystalline silicon using transient electron-beam-induced current

By Kushida Takuya   Tanaka Shigeyasu   Morita Chiaki   Tanji Takayoshi   Ohshita Yoshio  

Journal of Electron Microscopy, Vol. 61, Iss. 5, 2012-10 ,pp. : 293-298

Oxford University Press

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Electron-Beam-Induced-Current Investigation of GaN/AlGaN/Si Heterostructures Using Scanning Transmission Electron Microscopy

By Tanaka Shigeyasu   Aoyama Kentaro   Ichihashi Mikio   Arai Shigeo   Honda Yoshio   Sawaki Nobuhiko  

Journal of Electron Microscopy, Vol. 56, Iss. 4, 2007-08 ,pp. : 141-144

Oxford University Press

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