Review of MEMS metrology solutions

Author: Nichols James F.   Shilling Meghan   Kurfess Thomas R.  

Publisher: Inderscience Publishers

ISSN: 1368-2148

Source: International Journal of Manufacturing Technology and Management, Vol.13, Iss.2-3, 2008-01, pp. : 344-359

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract