Structural properties and electrical resistivity of TiNx and Ti1−xAlxN films prepared by reactive dc magnetron sputtering: effect of nitrogen flowrate

Author: Irudayaraj A. A.   Kuppusami P.   Kalainathan S.  

Publisher: Maney Publishing

ISSN: 1743-2944

Source: Surface Engineering, Vol.24, Iss.1, 2008-01, pp. : 28-35

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