Validation of a new facility at the Metrology Light Source for the calibration of radiation sources in the wavelength range from 116 nm to 400 nm

By Thornagel Reiner   Klein Roman   Kroth Simone   Paustian Wolfgang   Richter Mathias  

Metrologia, Vol. 51, Iss. 5, 2014-10 ,pp. : 528-538

IOP Publishing

Access to resources Recommend Favorite

Wavelength measurements of three iodine lines between 780 nm and 795 nm

By Bodermann B.   Bonsch G.   Knockel H.   Nicolaus A.   Tiemann E.  

Metrologia, Vol. 35, Iss. 2, 1998-05 ,pp. : 105-113

IOP Publishing

Access to resources Recommend Favorite

Metrological implications of recent interferometric wavelength measurements for singly ionized silicon in the vacuum ultraviolet (152 nm and 180 nm)

By Reader J.  

Metrologia, Vol. 39, Iss. 4, 2002-12 ,pp. : 391-394

IOP Publishing

Access to resources Recommend Favorite

Characterization of photodiodes as transfer detector standards in the 120 nm to 600 nm spectral range

By Kuschnerus P.   Rabus H.   Richter M.   Scholze F.   Werner L.   Ulm G.  

Metrologia, Vol. 35, Iss. 4, 1998-08 ,pp. : 355-362

IOP Publishing

Access to resources Recommend Favorite

Calibration of an InGaAs photodiode at 1300 nm with a cryogenic radiometer and a diode laser

By Atkinson E. G.   Butler D. J.  

Metrologia, Vol. 35, Iss. 4, 1998-08 ,pp. : 241-245

IOP Publishing

Access to resources Recommend Favorite