Degradation of Au–Ti contacts of SiGe HBTs during electromagnetic field stress

Author： Alaeddine A   Genevois C   Kadi M   Cuvilly F   Daoud K  

Publisher： IOP Publishing

ISSN： 0268-1242

Source： Semiconductor Science and Technology, Vol.26, Iss.2, 2011-02, pp. : 25003-25008

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