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Semiconductor Science and Technology, Vol. 29, Iss. 4, 2014-04 ,pp. : 45001-45006

IOP Publishing

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Effects of thermal annealing on the electrical characteristics of In-Ga-Zn-O thin-film transistors with Al2O3 gate dielectric

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Semiconductor Science and Technology, Vol. 30, Iss. 1, 2015-01 ,pp. : 15003-15007

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UV-assisted rapid thermal annealing for solution-processed zinc oxide thin-film transistors

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Semiconductor Science and Technology, Vol. 29, Iss. 9, 2014-09 ,pp. : 95019-95024

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Effect of annealing temperature on structural and electrical properties of high-κ YbTixOy gate dielectrics for InGaZnO thin film transistors

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Semiconductor Science and Technology, Vol. 30, Iss. 1, 2015-01 ,pp. : 15004-15011

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The effect of annealing temperature on the stability of gallium tin zinc oxide thin film transistors

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Semiconductor Science and Technology, Vol. 30, Iss. 10, 2015-10 ,pp. : 105004-105012

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