Comparison of fluorine determination in biological and environmental samples by NAA, PAA and PIXE

By Havránek V.   Kučera J.   Řanda Z.   Voseček V.  

Journal of Radioanalytical and Nuclear Chemistry, Vol. 259, Iss. 2, 2004-02 ,pp. : 325-329

Springer Publishing Company

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Quantitative analysis of the Ge concentration in a SiGe quantum well: comparison of low-energy RBS and SIMS measurements

By Krecar D.   Rosner M.   Draxler M.   Bauer P.   Hutter H.  

Analytical and Bioanalytical Chemistry, Vol. 384, Iss. 2, 2006-01 ,pp. : 525-530

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Depth profiles of shallow implanted layers by soft ion sputtering and total-reflection X-ray fluorescence

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Erbium and Germanium Profiles in Si_{1 – x}Ge_x Layers Grown by Silicon Sublimation-Source Molecular-Beam Epitaxy in GeH₄

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Inorganic Materials, Vol. 39, Iss. 1, 2003-01 ,pp. : 3-5

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Use of combined NAA and SIMS analyses for impurity level isotope detection

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Journal of Radioanalytical and Nuclear Chemistry, Vol. 263, Iss. 3, 2005-02 ,pp. : 691-696

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