Synchrotron radiation total reflection X-ray fluorescence (SR-TXRF) for evaluation of food contamination

By Vives A. E. S.   Moreira S.   Brienza S. M. B.   Zucchi O. L. A.   Nascimento Filho V. F.  

Journal of Radioanalytical and Nuclear Chemistry, Vol. 270, Iss. 1, 2006-10 ,pp. : 147-153

Springer Publishing Company

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Analysis of depth profile for impurity concentration in Si wafer by synchrotron radiation excited total reflection X-ray fluorescence spectroscopy

By Huh B.-K.   Kim J.-S.   Shin N.-S.   Koo Y.-M.   Chung H.-Y.  

Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, Iss. 8, 2003-08 ,pp. : 1445-1452

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Analysis of mineral water from Brazil using total reflection X-ray fluorescence by synchrotron radiation

By Costa A.C.M.   Anjos M.J.   Moreira S.   Lopes R.T.   de Jesus E.F.O.  

Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, Iss. 12, 2003-12 ,pp. : 2199-2204

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A wavelength-dispersive arrangement for wafer analysis with total reflection X-ray fluorescence spectrometry using synchrotron radiation

By Schwenke H.   Beaven P.A.   Knoth J.   Jantzen E.  

Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, Iss. 12, 2003-12 ,pp. : 2039-2048

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Analysis of beers from Brazil with synchrotron radiation total reflection X-ray fluorescence

By Moreira S.   Vives A. E. S.   Zucchi O. L. A. D.   de Jesus E. F. O.   Nascimento Filho V. F.   Brienza S. M. B.  

Journal of Radioanalytical and Nuclear Chemistry, Vol. 270, Iss. 1, 2006-10 ,pp. : 167-171

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