Phase-change characteristics of nitrogen-doped Ge2Sb2Te5 films during annealing process

Author: Kim Ki-Hong   Chung Jae-Gwan   Kyoung Yong   Park Ju-Cheol   Choi Sang-Jun  

Publisher: Springer Publishing Company

ISSN: 0957-4522

Source: Journal of Materials Science: Materials in Electronics, Vol.22, Iss.1, 2011-01, pp. : 52-55

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