RADIATION INDUCED DEFECTS IN SiO2

Author： FITTING H.- J.   TRUKHIN A. N.   BARFELS T.   SCHMIDT B.   CZARNOWSKI A. VON  

Publisher： Taylor & Francis Ltd

ISSN： 1042-0150

Source： Radiation Effects and Defects in Solids, Vol.157, Iss.6-12, 2002-01, pp. : 575-581

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