Characterisation of MEMS Devices Using A Polarisation Interferometer

Author: Jenkins David   Clegg Warwick   Liu Xinqun   Fribourg-Blanc Eric   Cattan Eric   Remiens Denis  

Publisher: Taylor & Francis Ltd

ISSN: 1058-4587

Source: Integrated Ferroelectrics, Vol.50, Iss.1, 2002-01, pp. : 91-99

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Abstract