Simulation of electrical characteristics and structural optimization for small-scaled dual-gate GeOI MOSFET with high-k gate dielectric

Author： Yurong Bai Jingping Xu Lu Liu Minmin Fan

Publisher： IOP Publishing

ISSN： 1674-4926

Source： Journal of Semiconductors, Vol.35, Iss.9, 2014-09, pp. : 94002-94007

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