Publisher: IOP Publishing
ISSN: 1742-6596
Source: Journal of Physics: Conference Series , Vol.489, Iss.1, 2014-03, pp. : 336-340
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Effect of ultrasonic treatment on the defect structure of the Si-SiO 2 system
By Kropman D. Poll V. Tambek L. Karner T. Abru U.
Ultrasonics, Vol. 36, Iss. 10, 1998-10 ,pp. :
Journal of Physics: Conference Series , Vol. 513, Iss. 5, 2014-06 ,pp. :