Impact of barrier thickness on gate capacitance—modeling and comparative analysis of GaN based MOSHEMTs

Author: Jena Kanjalochan   Swain Raghunandan   Lenka T. R.  

Publisher: IOP Publishing

ISSN: 1674-4926

Source: Journal of Semiconductors, Vol.36, Iss.3, 2015-03, pp. : 34003-34007

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Abstract