Time-dependent degradation of threshold voltage in AlGaN/GaN high electron mobility transistors

Author： Xiao-Hua Ma   Yuan-Qi Jiang   Xin-Hua Wang   Min Lü   Huo Zhang   Wei-Wei Chen   Xin-Yu Liu  

Publisher： IOP Publishing

ISSN： 1674-1056

Source： Chinese Physics B, Vol.23, Iss.1, 2014-01, pp. : 17303-17306

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