Analytical modeling of the direct tunneling current through high-k gate stacks for long-channel cylindrical surrounding-gate MOSFETs

Author: Lina Shi   Yiqi Zhuang   Cong Li   Dechang Li  

Publisher: IOP Publishing

ISSN: 1674-4926

Source: Journal of Semiconductors, Vol.35, Iss.3, 2014-03, pp. : 34009-34014

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