Investigation of GaAs/AlGaAs interfaces by reflectance-difference spectroscopy

Author: Ye Xiaoling   Chen Y. H.   Xu Bo   Zeng Y. P.   Wang Z. G.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|27|1-3|297-300

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.27, Iss.1-3, 2010-03, pp. : 297-300

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