Author: Frevert C Crump P Bugge F Knigge S Erbert G
Publisher: IOP Publishing
E-ISSN: 1361-6641|31|2|25003-25014
ISSN: 0268-1242
Source: Semiconductor Science and Technology, Vol.31, Iss.2, 2016-02, pp. : 25003-25014
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Abstract