Contrast analysis of Shockley partial dislocations in 4H-SiC observed by synchrotron Berg–Barrett X-ray topography

Author： Matsuhata Hirofumi Yamaguchi Hirotaka Yamashita Tamotsu Tanaka Toshiaki Chen Bin Sekiguchi Takashi

ISSN： 1478-6443

Source： Philosophical Magazine, Vol.94, Iss.15, 2014-05, pp. : 1674-1685

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