Subgap states in p-channel tin monoxide thin-film transistors from temperature-dependent field-effect characteristics

Author: JeongChan-Yong   LeeDaeun   HanYoung-Joon   ChoiYong-Jin   KwonHyuck-In  

Publisher: IOP Publishing

E-ISSN: 1361-6641|30|8|85004-85009

ISSN: 0268-1242

Source: Semiconductor Science and Technology, Vol.30, Iss.8, 2015-08, pp. : 85004-85009

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