Microstructural investigations of SrTiO3 single crystals and polysilicon using a powerful new X‐ray diffraction surface mapping technique
Publisher： John Wiley & Sons Inc
E-ISSN： 1600-5767|48|6|1883-1888
ISSN： 0021-8898
Source： JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.48, Iss.6, 2015-12, pp. : 1883-1888
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