A new micro‐furnace for in situ high‐temperature single‐crystal X‐ray diffraction measurements
Publisher： John Wiley & Sons Inc
E-ISSN： 1600-5767|48|4|1192-1200
ISSN： 0021-8898
Source： JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.48, Iss.4, 2015-08, pp. : 1192-1200
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