Interpretation of electron diffraction patterns in the presence of oriented planar faults

E-ISSN： 1600-5767|48|6|1921-1926

ISSN： 0021-8898

Source： JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.48, Iss.6, 2015-12, pp. : 1921-1926

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Signature of dislocations and stacking faults of face‐centred cubic nanocrystals in coherent X‐ray diffraction patterns: a numerical study

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol. 48, Iss. 3, 2015-06 ,pp. : 621-644

John Wiley & Sons Inc

Access to resources Recommend Favorite

Fast electron diffraction tomography

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol. 48, Iss. 3, 2015-06 ,pp. : 718-727

John Wiley & Sons Inc

Access to resources Recommend Favorite

Correct interpretation of diffraction properties of quartz crystals for X‐ray optics applications

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol. 51, Iss. 1, 2018-02 ,pp. : 140-147

John Wiley & Sons Inc

Access to resources Recommend Favorite

Problem of elastic anisotropy and stacking faults in stress analysis using multireflection grazing‐incidence X‐ray diffraction

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol. 48, Iss. 2, 2015-04 ,pp. : 492-509

John Wiley & Sons Inc

Access to resources Recommend Favorite

Structure analysis of montmorillonite crystallites by convergent-beam electron diffraction

By Beermann T. Brockamp O.

Clay Minerals, Vol. 40, Iss. 1, 2005-03 ,pp. : 1-14

Mineralogical Society

Access to resources Recommend Favorite