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Author: Yanyue Li Xiaochuan Deng Yunfeng Liu Yanli Zhao Chengzhan Li Xixi Chen Bo Zhang
Publisher: IOP Publishing
ISSN: 1674-4926
Source: Journal of Semiconductors, Vol.36, Iss.9, 2015-09, pp. : 94003-94006
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
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