A new drain current model for amorphous IGZO thin film transistors

Author: Qiang Lei   Yao Ruo-He  

Publisher: Edp Sciences

E-ISSN: 1286-0050|70|1|10101-10101

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.70, Iss.1, 2015-04, pp. : 10101-10101

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Abstract