A high‐transparency, micro‐patternable chip for X‐ray diffraction analysis of microcrystals under native growth conditions

Publisher： John Wiley & Sons Inc

E-ISSN： 1399-0047|71|10|1987-1997

ISSN： 0907-4449

Source： ACTA CRYSTALLOGRAPHICA SECTION D (ELECTRONIC), Vol.71, Iss.10, 2015-10, pp. : 1987-1997

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