Low Temperature Internal Gettering of Bulk Defects in Silicon Photovoltaic Materials

Publisher： Trans Tech Publications

E-ISSN： 1662-9779|2015|242|109-119

ISSN： 1012-0394

Source： Solid State Phenomena, Vol.2015, Iss.242, 2016-02, pp. : 109-12

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Boron-Related Defects in Low Temperature Irradiated Silicon

By  

Solid State Phenomena, Vol. 2015, Iss. 242, 2016-02 ,pp. : 285-6

Trans Tech Publications

Access to resources Recommend Favorite

Enhanced Internal Gettering of Iron in n/n+ Epitaxial Silicon Wafer: Effect of High Temperature Rapid Thermal Annealing in Nitrogen Ambient

By  

Solid State Phenomena, Vol. 2015, Iss. 242, 2016-02 ,pp. : 218-223

Trans Tech Publications

Access to resources Recommend Favorite

Internal Gettering of Copper for Microelectronic Applications

By  

Solid State Phenomena, Vol. 2015, Iss. 242, 2016-02 ,pp. : 236-11

Trans Tech Publications

Access to resources Recommend Favorite

Low temperature nanocrystalline zinc oxide for photovoltaic applications

By  

IOP Conference Series: Materials Science and Engineering, Vol. 80, Iss. 1, 2015-04 ,pp. : 49-53

IOP Publishing

Access to resources Recommend Favorite

Low Temperature Activation of Grown-In Defects Limiting the Lifetime of High Purity n-Type Float-Zone Silicon Wafers

By  

Solid State Phenomena, Vol. 2015, Iss. 242, 2016-02 ,pp. : 120-125

Trans Tech Publications

Access to resources Recommend Favorite