MEMS reliability modelling methodology: application to wobble micromotor failure analysis.

By Muratet S.   Fourniols J.   Soto-Romero G.   Endemano A.   Marty A.   Desmulliez M.  

Microelectronics Reliability, Vol. 43, Iss. 9, 2003-09 ,pp. : 1945-1949

Elsevier

Access to resources Recommend Favorite

Application of MEMS behavioral simulation to Physics of Failure (PoF) modeling

By Schmitt P.   Pressecq F.   Lafontan X.   Duong Q.H.   Pons P.   Nicot J.M.   Oudea C.   Esteve D.   Fourniols J.Y.   Camon H.  

Microelectronics Reliability, Vol. 43, Iss. 9, 2003-09 ,pp. : 1957-1962

Elsevier

Access to resources Recommend Favorite

A new method for quantum device simulation

By Sharifi Mohammad J.   Adibi A.  

International Journal of Electronics, Vol. 86, Iss. 9, 1999-09 ,pp. : 1051-1062

Taylor & Francis Ltd

Access to resources Recommend Favorite

No flow underfill: additional reliability and failure mode analysis

By Previti Michael A   Ongley Peter  

Microelectronics International, Vol. 19, Iss. 2, 2002-06 ,pp. : 32-37

Emerald Group Publishing Ltd

Access to resources Recommend Favorite

Simulation and Optimization for System Integration of a Solar Thermoelectric Device

By Yang Tianqi  

Journal of Electronic Materials, Vol. 40, Iss. 5, 2011-05 ,pp. : 967-973

Springer Publishing Company

Access to resources Recommend Favorite