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Benchmarking of GFET devices for amplifier application using multiscale simulation approach

By Fregonese Sebastien,Potereau Manuel,Deltimple Nathalie,Maneux Cristell,Zimmer Thomas in (2013)

Springer Publishing Company

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Computational predictive models for organic semiconductors

By Sajeev R.,Athira R.,Nufail M.,Jinu Raj K.,Rakhila M.,Nair Sreejith,Abdul Jaleel U.,Manuel Andrew in (2013)

Springer Publishing Company

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Atomistic calculations of the electronic, thermal, and thermoelectric properties of ultra-thin Si layers

By Neophytou Neophytos,Karamitaheri Hossein,Kosina Hans in (2013)

Springer Publishing Company

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Influence of distance between adjacent tubes on SWCNT bundle interconnect delay and power dissipation

By Rai Mayank,Sarkar Sankar in (2013)

Springer Publishing Company

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Atomistic modeling of semiconductor interfaces

By Blom Anders,Stokbro Kurt in (2013)

Springer Publishing Company

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Modeling of Cu-linked rectification devices by varying torsion angles

By Parashar Sweta,Srivastava Pankaj,Pattanaik Manisha in (2013)

Springer Publishing Company

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Investigation of the RTN amplitude statistics of nanoscale MOS devices by the statistical impedance field method

By Torrente Giulio,Castellani Niccolò,Ghetti Andrea,Monzio Compagnoni Christian,Lacaita Andrea,Spinelli Alessandro,Benvenuti Augusto in (2013)

Springer Publishing Company

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Multilevel modeling for charge transport in Ovonic chalcogenide materials and devices

By Rudan M.,Giovanardi F.,Piccinini E.,Buscemi F.,Brunetti R.,Cappelli A.,Marcolini G.,Jacoboni C. in (2013)

Springer Publishing Company

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Junctionless MOSFETs with laterally graded-doping channel for analog/RF applications

By Chen Yongbo,Mohamed Mohamed,Jo Michael,Ravaioli Umberto,Xu Ruimin in (2013)

Springer Publishing Company

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Self-consistent time-dependent boundary conditions for static and dynamic simulations of small electron devices

By Albareda G.,Benali A.,Oriols X. in (2013)

Springer Publishing Company

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