Reliability testing of flexible printed circuit-based RF MEMS capacitive switches

Author： Lee S. Ramadoss R. Buck M. Bright V.M. Gupta K.C. Lee Y.C.

Publisher： Elsevier

ISSN： 0026-2714

Source： Microelectronics Reliability, Vol.44, Iss.2, 2004-02, pp. : 245-250

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