The impact of the distributed RC effect on high frequency noise modeling of bipolar transistor

Author： Lee W.-K. Man T.Y. Mok P.K.T. Ko P.K. Chan M.

Publisher： Elsevier

ISSN： 0038-1101

Source： Solid-State Electronics, Vol.48, Iss.2, 2004-02, pp. : 297-308

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