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Period of time: 2004年2期
Publisher: Elsevier
Founded in: 1960
Total resources: 4
ISSN: 0038-1101
Subject: TN Radio Electronics, Telecommunications Technology
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Solid-State Electronics,volume 48,issue 2
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By Chang S.T., Liu C.W., Lu S.C. in (2004)
Solid-State Electronics,volume 48,issue 2 , Vol. 48, Iss. 2, 2004-02 , pp.![](/images/ico/ico5.png)
By Kuntman A., Ardali A., Kuntman H., Kacar F. in (2004)
Solid-State Electronics,volume 48,issue 2 , Vol. 48, Iss. 2, 2004-02 , pp.![](/images/ico/ico5.png)
By Jankovic N.D., O'Neill A. in (2004)
Solid-State Electronics,volume 48,issue 2 , Vol. 48, Iss. 2, 2004-02 , pp.![](/images/ico/ico5.png)
Performance assessment of scaled strained-Si channel-on-insulator (SSOI) CMOS
By Kim K., Chuang C.-T., Rim K., Joshi R.V. in (2004)
Solid-State Electronics,volume 48,issue 2 , Vol. 48, Iss. 2, 2004-02 , pp.![](/images/ico/ico5.png)
A 200 V silicon-on-sapphire LDMOS structure with a step oxide extended field plate
By Roig J., Flores D., Rebollo J., Hidalgo S., Millan J. in (2004)
Solid-State Electronics,volume 48,issue 2 , Vol. 48, Iss. 2, 2004-02 , pp.![](/images/ico/ico5.png)
Analysis and design criteria for traveling-wave MESFET
By Kaddour M., Gharsallah A., Gharbi A., Baudrand H. in (2004)
Solid-State Electronics,volume 48,issue 2 , Vol. 48, Iss. 2, 2004-02 , pp.![](/images/ico/ico5.png)
By Yang J.-W., Fossum J.G., Workman G.O., Huang C.-L. in (2004)
Solid-State Electronics,volume 48,issue 2 , Vol. 48, Iss. 2, 2004-02 , pp.![](/images/ico/ico5.png)
Electrical overstress in AlGaN/GaN HEMTs: study of degradation processes
By Kuzmik J., Pogany D., Gornik E., Javorka P., Kordos P. in (2004)
Solid-State Electronics,volume 48,issue 2 , Vol. 48, Iss. 2, 2004-02 , pp.![](/images/ico/ico5.png)
Performance evaluation of SiGe heterojunction bipolar transistors on virtual substrates
By Jankovic N.D., O'Neill A. in (2004)
Solid-State Electronics,volume 48,issue 2 , Vol. 48, Iss. 2, 2004-02 , pp.