Related content

Ferroelectric thin and thick films for microsystems

By Whatmore R.W.   Zhang Q.   Huang Z.   Dorey R.A.  

Materials Science in Semiconductor Processing, Vol. 5, Iss. 2, 2002-04 ,pp. : 65-76

Elsevier

Access to resources Recommend Favorite

Magnetic emission mapping for passive integrated components characterisation

By Crepel O.   Desplats R.   Bouttement Y.   Perdu P.   Goupil C.   Descamps P.   Beaudoin F.   Marina L.  

Microelectronics Reliability, Vol. 43, Iss. 9, 2003-09 ,pp. : 1809-1814

Elsevier

Access to resources Recommend Favorite

The effects of baking cycles on the properties of ferroelectric thin films

By Watts B.E.   Leccabue F.   Fanciulli M.   Ferrari S.   Tallarida G.  

Materials Science in Semiconductor Processing, Vol. 5, Iss. 2, 2002-04 ,pp. : 147-152

Elsevier

Access to resources Recommend Favorite

Passive On-Chip Components for Fully Integrated Silicon RF VCOs

By Kyranas Aristides   Papananos Yannis  

Active and Passive Electronic Components, Vol. 25, Iss. 1, 2002-01 ,pp. : 83-95

Taylor & Francis Ltd

Access to resources Recommend Favorite

Dielectric and ferroelectric properties of in-plane lead lanthanum titanate thin films

By Song Z.T.   Chan H.L.W.   Choy C.L.   Lin C.L.  

Microelectronic Engineering, Vol. 66, Iss. 1, 2003-04 ,pp. : 887-890

Elsevier

Access to resources Recommend Favorite