Characteristics of an Indium-Rich InGaN p-n Junction Grown on a Strain-Relaxed InGaN Buffer Layer

Author: Lian-Hong Yang   Bao-Hua Zhang   Fu-Qiang Guo  

Publisher: IOP Publishing

ISSN: 0256-307X

Source: Chinese Physics Letters, Vol.30, Iss.4, 2013-04, pp. : 47301-47303

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