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Author: Witte W. Reuters B. Fahle D. Behmenburg H. Wang K.R. Trampert A. Holländer B. Hahn H. Kalisch H. Heuken M. Vescan A.
Publisher: IOP Publishing
ISSN: 0268-1242
Source: Semiconductor Science and Technology, Vol.28, Iss.8, 2013-08, pp. : 85006-85011
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
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