Modeling of strain effects on the device behaviors of ferroelectric memory field-effect transistors

Author: Yang Feng   Hu Guangda   Wu Weibing   Yang Changhong   Wu Haitao   Tang Minghua  

Publisher: IOP Publishing

ISSN: 0268-1242

Source: Semiconductor Science and Technology, Vol.28, Iss.8, 2013-08, pp. : 82001-82005

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Abstract