Comparison of hot-hole injections in ultrashort channel LDD nMOSFETs with ultrathin oxide under an alternating stress

Author： Hai-Feng Chen   Yue Hao   Xiao-Hua Ma   Yan-Rong Cao   Zhi-Yuan Gao   Xin Gong  

Publisher： IOP Publishing

ISSN： 1009-1963

Source： Chinese Physics, Vol.16, Iss.10, 2007-10, pp. : 3114-3119

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