Transmission electron microscopy study of silicon nitride amorphous films obtained by reactive pulsed laser deposition

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Thin Solid Films, Vol. 397, Iss. 1, 2001-10 ,pp. : 12-16

Elsevier

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High-resolution transmission electron microscopy study of luminescent anodized amorphous silicon

By Bustarret E.   Sauvain E.   Ligeon M.  

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Taylor & Francis Ltd

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MgH2 → Mg phase transformation driven by a high-energy electron beam: An in situ transmission electron microscopy study

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Transmission electron microscopy study of Ni silicides formed during metal-induced silicon growth

By Guliants E.A.   Anderson W.A.   Guo L.P.   Guliants V.V.  

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Comparison of atomic force microscopy and transmission electron microscopy of second-phase particles

By Lagerpusch Ulrike   Anczykowski Boris   Nembach Eckhard  

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