Decomposition and modulated structure formation during amorphous Si 1-x Ge x crystallization

Author: Edelman F.   Komem Y.   Werner P.   Heydenreich J.   Iyer S.S.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.266, Iss.2, 1995-10, pp. : 212-214

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Abstract