Electrophysical studies of 2D-hole spectral characteristics and peculiarities of scattering mechanisms in Ge layers of Ge-Ge 1-x Si x heterostructures

Author: Orlov L.K.   Potapov A.V.   Rubtsova R.A.   Arapov Y.   Gorodilov N.   Shelushinina N.   Goiran M.   Leotin J.   Yang F.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.294, Iss.1, 1997-02, pp. : 208-210

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract