Thermal emission of holes from confined levels in strained SiGe channel p-MOSFETS

Author: Gamez-Cuatzin H.   Marchand J.-J.   Bremond G.   Garchery L.   Campidelli Y.   Berenguer M.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.294, Iss.1, 1997-02, pp. : 211-213

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Abstract