Distributed growth model used for the interpretation of RHEED intensity oscillations observed during the growth of Pb on Si(111) substrates

Author： Daniluk A.   Mazurek P.   Paprocki K.   Mikolajczak P.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.306, Iss.2, 1997-09, pp. : 228-230

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