Author: Selwyn G.S. Weiss C.A. Sequeda F. Huang C.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.317, Iss.1, 1998-04, pp. : 85-92
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
In-situ monitoring for CVD processes
By Hopfe V. Sheel D.W. Spee C.I.M.A. Tell R. Martin P. Beil A. Pemble M. Weiss R. Vogt U. Graehlert W.
Thin Solid Films, Vol. 442, Iss. 1, 2003-10 ,pp. :
Philosophical Magazine Letters, Vol. 84, Iss. 6, 2004-06 ,pp. :
Growth of (111)-oriented PZT on RuO 2 (100)/Pt(111) electrodes by in-situ sputtering
By Maeder T. Muralt P. Sagalowicz L.
Thin Solid Films, Vol. 345, Iss. 2, 1999-05 ,pp. :