Combined characterization of group IV heterostructures and materials by spectroscopic ellipsometry and grazing X-ray reflectance

By Boher P.   Stehle J.L.   Hennet L.  

Thin Solid Films, Vol. 294, Iss. 1, 1997-02 ,pp. : 37-42

Elsevier

Access to resources Recommend Favorite

In situ monitoring of MOVPE growth by combined spectroscopic ellipsometry and reflectance-difference spectroscopy

By Ebert M.   Bell K.A.   Yoo S.D.   Flock K.   Aspnes D.E.  

Thin Solid Films, Vol. 364, Iss. 1, 2000-03 ,pp. : 22-27

Elsevier

Access to resources Recommend Favorite

Characterization of silicon oxynitride films by grazing-emission X-ray fluorescence spectrometry

By Monaghan M.L.   Nigam T.   Houssa M.   De Gendt S.   Urbach H.P.   de Bokx P.K.  

Thin Solid Films, Vol. 359, Iss. 2, 2000-01 ,pp. : 197-202

Elsevier

Access to resources Recommend Favorite

X-ray, thermal and infrared spectroscopic studies on lithium and sodium oxalate hydrates

By Dahale N.D.   Chawla K.L.   Jayadevan N.C.   Venugopal V.  

Thermochimica Acta, Vol. 293, Iss. 1, 1997-06 ,pp. : 163-166

Elsevier

Access to resources Recommend Favorite

Characterization of polyacrylonitrile films grafted onto nickel by ellipsometry, atomic force microscopy and X-ray reflectivity

By Arys X.   Jonas A.M.   Legras R.   Calberg C.   Mertens M.   Jerome R.  

Thin Solid Films, Vol. 310, Iss. 1, 1997-11 ,pp. : 148-155

Elsevier

Access to resources Recommend Favorite